GA-based test generation for sequential circuits
statement of authorship
M. Brik, J. Raik, R. Ubar, E. Ivask
location of publication
[Kharkov]
year of publication
pages
p. 30-34
conference name, date
2nd East-West Design & Test Workshop, 23-26 September, 2004
conference location
Yalta, Alushta, Crimea, Ukraine
ISBN
966-659-088-3
TTÜ department
language
inglise
Brik, M., Raik, J., Ubar, R.-J., Ivask, E. GA-based test generation for sequential circuits // Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004. [Kharkov], 2004. p. 30-34.