Teaching digital test with BIST analyzer
author
Jutman, Artur
Tšertov, Anton
Tšepurov, Anton
Aleksejev, Igor
Ubar, Raimund-Johannes
Wuttke, Heinz-Dietrich
statement of authorship
A. Jutman, A. Tsertov, A. Tsepurov, I. Aleksejev, R. Ubar, H.-D. Wuttke
source
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
location of publication
[S.l.]
publisher
IEEE
year of publication
2008
pages
p. 123-128 : ill
conference name, date
19th EAEEIE Annual Conference, June 29-July 2, 2008
conference location
Tallinn, Estonia
url
http://dx.doi.org/10.1109/EAEEIE.2008.4610171
subject term
integraallülitused
testimine
ISBN
978-1-4244-2008-7
notes
Bibliogr.: 8 ref
TalTech department
arvutitehnika instituut
language
inglise