Fault diagnosis in integrated circuits with BIST
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evartson, Harri Lensen
location of publication
Los Alamitos
publisher
year of publication
pages
p. 604-610 : ill
conference name, date
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, 29-31 August, 2007
conference location
Lübeck, Germany
ISBN
978-0-7695-2978-3
notes
Bibliogr.: 16 ref
TTÜ department
language
inglise
Ubar, R.-J., Kostin, S., Raik, J., Evartson, T., Lensen, H. Fault diagnosis in integrated circuits with BIST // 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings. Los Alamitos : IEEE Computer Society, 2007. p. 604-610 : ill.