Pleskacz, W.A., Borejko, T., Walkanis, A., Stopjakova, V., Jutman, A., Ubar, R.-J.

full record print

DefSim: CMOS defects on chip for research and education

author

Pleskacz, Witold A.

Borejko, Tomasz

Walkanis, A.

Stopjakova, Viera

Jutman, Artur

Ubar, Raimund-Johannes

statement of authorship

W.A.Pleskacz, T.Borejko, A.Walkanis, V.Stopjakova, A.Jutman, R.Ubar

source

7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings

location of publication

Porto Alegre

publisher

Evangraf

year of publication

2006

pages

p. 74-79 : ill

ISBN

85-7727-022-X

notes

Bibliogr.: 11 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

integraallülitused

vead

uuringud

Pleskacz, W.A., Borejko, T., Walkanis, A., Stopjakova, V., Jutman, A., Ubar, R.-J. DefSim: CMOS defects on chip for research and education // 7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings. Porto Alegre : Evangraf, 2006. p. 74-79 : ill.