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How to generate high quality tests for digital systems

author
Ubar, Raimund-Johannes
Aarna, Margit
Kruus, Helena
Raik, Jaan
statement of authorship
R. Ubar, M. Aarna, H. Kruus, J. Raik
source
2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 2
location of publication
[S.l.]
publisher
IEEE
year of publication
2004
pages
p. 459-462 : ill
url
http://dx.doi.org/10.1109/SMICND.2004.1403048
subject term
digitaaltehnika
defektid
otsustusdiagrammid
testimine
keyword
digital systems
physical defects
decision diagrams
functional fault model
hierarchical testing
ISBN
0-7803-8499-7
notes
Bibliogr.: 11 ref
TalTech department
arvutitehnika instituut
language
inglise
Ubar, R.-J., Aarna, M., Kruus, H., Raik, J. How to generate high quality tests for digital systems // 2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 2. [S.l.] : IEEE, 2004. p. 459-462 : ill. http://dx.doi.org/10.1109/SMICND.2004.1403048