Electron microscopy study of contact layers in n-type 4H-SiC after diffusion welding
statement of authorship
O.Korolkov, N.Sleptsuk, A.Sitnikova, and T.Rang
location of publication
[Tallinn]
publisher
year of publication
pages
p. 91-94 : ill
subject term
ISBN
978-1-4244-2059-9
notes
Bibliogr.: 7 ref
language
inglise
Korolkov, O., Sleptsuk, N., Sitnikova, A., Rang, T. Electron microscopy study of contact layers in n-type 4H-SiC after diffusion welding // BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia. [Tallinn] : Tallinn University of Technology, 2008. p. 91-94 : ill.