Korolkov, O., Sleptsuk, N., Sitnikova, A., Rang, T.

prindi

Electron microscopy study of contact layers in n-type 4H-SiC after diffusion welding

autor

Korolkov, Oleg

Sleptšuk, Natalja

Sitnikova, A.

Rang, Toomas

vastutusandmed

O.Korolkov, N.Sleptsuk, A.Sitnikova, and T.Rang

allikas

BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia

ilmumiskoht

[Tallinn]

kirjastus/väljaandja

Tallinn University of Technology

ilmumisaasta

2008

leheküljed

p. 91-94 : ill

märksõna

elektronmikroskoopia

ränikarbiid

piirpinnad

keevitus

difusioon (füüsika)

ISBN

978-1-4244-2059-9

märkused

Bibliogr.: 7 ref

keel

inglise

Korolkov, O., Sleptsuk, N., Sitnikova, A., Rang, T. Electron microscopy study of contact layers in n-type 4H-SiC after diffusion welding // BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia. [Tallinn] : Tallinn University of Technology, 2008. p. 91-94 : ill.