Parallel X-fault simulation with critical path tracing technique [Electronic resource]
statement of authorship
Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman
source
DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010
location of publication
[Dresden]
publisher
year of publication
pages
p. 879-884 [CD-ROM]
conference name, date
DATE : Design, Automation & Test in Europe, 8-12 March, 2010
conference location
Dresden, Germany
subject term
ISBN
978-3-9810801-6-2
language
inglise
Ubar, R., Devadze, S., Raik, J., Jutman, A. Parallel X-fault simulation with critical path tracing technique [Electronic resource] // DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010. [Dresden] : IEEE, 2010. p. 879-884 [CD-ROM].