Deterministic defect-oriented test generation for combinational circuits
author
Raik, Jaan
Ubar, Raimund-Johannes
Sudbrock, Joachim
Kuzmicz, Wieslaw
Pleskacz, Witold A.
statement of authorship
Jaan Raik, Raimund Ubar, Joachim Sudbrock, Wieslaw Kuzmicz, Witold Pleskacz
source
LATW 2005 : 6th IEEE Latin-American Test Workshop : March 30 - April 2, 2005, Salvador, Bahia, Brazil : [digest of papers]
location of publication
[S. l.]
year of publication
2005
pages
p. 325-330 : ill
subject term
elektronlülitused
defektid
testimine
notes
Bibliogr.: 10 ref
language
inglise