Hierarchical defect-oriented fault simulation for digital circuits
author
Blyzniuk, M.
Cibakova, Tatiana
Gramatova, Elena
Kuzmicz, W.
Lobur, M.
Pleskacz, Witold A.
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
M.Blyzniuk, T.Cibakova, E.Gramatova, W.Kuzmicz, M.Lobur, W.Pleskacz, J.Raik, R.Ubar
source
IEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings
location of publication
Los Alamitos, CA
publisher
IEEE Computer Society
year of publication
2000
pages
p. 69-74 : ill
url
https://ieeexplore.ieee.org/document/873781
subject term
digitaalintegraallülitused
testimine
defektid
ISBN
0-7695-0701-8
notes
Bibliogr.: 13 ref
language
inglise