Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
author
Palermo, N.
Tihhomirov, Valentin
Copetti, Thiago
Jenihhin, Maksim
Raik, Jaan
Kostin, Sergei
statement of authorship
N. Palermo, V. Tihhomirov, T.S. Copetti, M. Jenihhin, J. Raik, S. Kostin, ... [et al.]
source
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
location of publication
[S.l.]
publisher
IEEE
year of publication
2015
pages
[6] p. : ill
conference name, date
16th Latin American Test Symposium, 25-27 March, 2015
conference location
Puerto Vallarta, Mexico
url
http://dx.doi.org/10.1109/LATW.2015.7102405
subject term
riistvara
elutsüklid (tehnika)
elektronlülitused
rikked
diagnostika (tehnika)
algoritmid
keyword
hardware rejuvenation
aging
NBTI
critical path identification
logic circuit
evolutionary computation
MicroGP
zamiaCAD
ISSN
2373-0862
ISBN
978-1-4673-6711-0
notes
Bibliogr.: 33 ref
TalTech department
arvutitehnika instituut
language
inglise