Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement
author
Blyzniuk, M.
Kazymyra, I.
Kuzmicz, W.
Pleskacz, Witold A.
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
M.Blyzniuk, I.Kazymyra, W.Kuzmicz, W.A.Pleskacz, J.Raik, R.Ubar
source
Microelectronics reliability
journal volume number month
Vol. 41
year of publication
2001
pages
p. 2023-2040 : ill
url
https://www.sciencedirect.com/science/article/pii/S0026271401000920
subject term
tõenäosus
analüüs
VLSI-ahelad
defektid
ISSN
0026-2714
notes
Bibliogr.: 31 ref
language
inglise