Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy

statement of authorship
E. Kask, M. Grossberg, R. Josepson, P. Salu, K. Timmo, J. Krustok
journal volume number month
Vol. 16, 3
year of publication
pages
p. 992-996 : ill
keyword
Cu2ZnSn(Se0.75S0.25)4
photoluminescence spectroscopy
ISSN
1369-8001
notes
Bibliogr.: 22 ref
language
inglise
Kask, E., Grossberg, M., Josepson, R., Salu, P., Timmo, K., Krustok, J. Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy // Materials science in semiconductor processing (2013) Vol. 16, 3, p. 992-996 : ill.