Code coverage analysis using high-level decision diagrams [Electronic resource]
statement of authorship
Jaan Raik, Uljana Reinsalu, Raimund Ubar, Maksim Jenihhin, Peeter Ellervee
location of publication
[S.l.]
publisher
year of publication
pages
p. 201-207 : ill. [CD-ROM]
subject term
ISBN
978-1-4244-2277-7
notes
Bibliogr.: 13 ref
language
inglise
Raik, J., Reinsalu, U., Ubar, R.-J., Jenihhin, M., Ellervee, P. Code coverage analysis using high-level decision diagrams [Electronic resource] // 2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008. [S.l.] : IEEE, 2008. p. 201-207 : ill. [CD-ROM]. https://ieeexplore.ieee.org/document/4538786