SiC-diodes forward surge current failure mechanisms : experiment and simulation
                                            author
                                    
                                    
                                
                                            statement of authorship
                                    
                                    
A.Udal and E.Velmre
                                                    
                                            
                                            source
                                    
                                    
                                
                                            publisher
                                    
                                    
                                
                                            journal volume number month
                                    
                                    
Vol. 37, 10/11
                                                    
                                            
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 1671-1674
                                                    
                                            
                                            ISSN
                                    
                                    
0026-2714
                                                    
                                            
                                            Open Access
                                    
                                    
Open Access
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            subject term
                                    
                                    
                                
                                            TalTech department
                                    
                                    
                                
                                    Udal, A., Velmre, E. SiC-diodes forward surge current failure mechanisms : experiment and simulation // Microelectronics reliability (1997) Vol. 37, 10/11, p. 1671-1674.