10th IEEE European Test Symposium
variant title
10th IEEE European Test Symposium
author
Ubar, Raimund-Johannes
Prinetto, Paolo
Raik, Jaan
statement of authorship
Raimund Ubar, Paolo Prinetto, Jaan Raik
source
IEEE journal of design & test of computers
journal volume number month
Vol. 22, 5
year of publication
2005
pages
p. 480-481 : phot
conference name, date
10th IEEE European Test Symposium, 22-25 May, 2005
conference location
Tallinn, Estonia
url
http://dx.doi.org/10.1109/MDT.2005.106
subject term
mikroelektroonika
elektronlülitused
integraallülitused
testimine
konverentsid
ISSN
0740-7475
TTÜ department
arvutitehnika instituut
language
inglise