Hierarchical identification of NBTI-critical gates in nanoscale logic
author
Kostin, Sergei
Raik, Jaan
Ubar, Raimund-Johannes
Jenihhin, Maksim
statement of authorship
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, ... [et al.]
source
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
location of publication
[S.l.]
publisher
IEEE
year of publication
2014
pages
[6] p. : ill
conference name, date
15th IEEE Latin-American Test Workshop, March 12-15, 2014
conference location
Fortaleza, Brazil
subject term
elektronlülitused
rikked
keyword
NBTI-critical gate
critical path identification
static timing analysis
aging
logic circuit
ISBN
978-1-4799-4711-9
notes
Bibliogr.: 13 ref
TalTech department
arvutitehnika instituut
language
inglise