An external test approach for network-on-a-chip switches
statement of authorship
Jaan Raik, Vineeth Govind, Raimund Ubar
location of publication
Kolkata
publisher
year of publication
pages
p. 185-190 : ill
subject term
ISBN
978-93-80813-12-7
notes
Bibliogr.: 14 ref
language
inglise
Raik, J., Govind, V., Ubar, R. An external test approach for network-on-a-chip switches // 2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium. Kolkata : IEEE, 2011. p. 185-190 : ill.