Optimization of the store-and-generate based built-in self-test
statement of authorship
R.Ubar, G.Jervan, H.Kruus, E.Orasson, I.Aleksejev
location of publication
[Tallinn]
publisher
year of publication
pages
p. 199-202 : ill
subject term
ISBN
1-4244-0414-2
notes
Bibliogr.: 17 ref
language
inglise
Ubar, R., Jervan, G., Kruus, H., Orasson, E., Aleksejev, I. Optimization of the store-and-generate based built-in self-test // BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference. [Tallinn] : Tallinn University of Technology, 2006. p. 199-202 : ill.