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About robustness of test patterns regarding multiple faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / p. 86-91 : ill https://www.infona.pl/resource/bwmeta1.element.ieee-art-000006261243

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Kuidas teemant tehnikaülikooli tuliRaik, JaanTallinna Tehnikaülikooli aastaraamat 20092010 / lk. 40-43 : ill https://www.ester.ee/record=b1212786*est

book article

Motivation-driven learning processes at the example of embedded systemsHollstein, Thomas; Reinsalu, Uljana; Leier, Mairo10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 3-6 : ill

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Prognostikasümpoosion. [Matemaatiliste meetodite ja arvutustehnika kasutamisest ettevõtete ja rahvamajandusharude arengu prognoosimisel]Lageda, PeeterEdasi : EKP Tartu Linnakomitee, EKP Tartu Rajoonikomitee, Tartu Linna RSN ja Tartu Rajooni RSN häälekandja1970 / lk. [?] https://www.ester.ee/record=b1271061*est

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Teaching embedded systems as a part of a computer engineering curriculaJervan, Gert; Gorev, Maksim; Pesonen, Vadim23rd EAEEIE annual conference, Cagliari, Italy, February 26-27, 20122012 / p. 1-4

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