Searching - TalTech Research Portal

AFM and SEM investigations of ion beam synthesized Mg2Si precipitates in Si substratesAngelov, Christo; Mikli, Valdek; Amov, Blagoj; Goranova, E.Journal of optoelectronics and advanced materials2005 / 1, p. 369-373 https://old.joam.inoe.ro/arhiva/pdf7_1/Angelov3.pdf

journal article

An XPS and AFM study of polypyrrole coating on mild steelIdla, Katrin; Talo, A.; Niemi, H.E.-M.; Forsen, Olof; Yläsaari, SeppoSurface and interface analysis1997 / 9, [18] p.: ill

journal article

Nanomechanical characterisation of materials by atomic force microscopyKollo, LauriNanopowders, Nanostuctured Materials and Coatings : Network for Nanostructured Materials of ACC : March 17, 2005, Tallinn, Estonia : book of abstracts2005 / p. 27

book article

Structural investigations of ion beam synthesized [beeta]-FeSi2Angelov, Christo; Amov, Blagoj; Mikli, Valdek; Traksmaa, RainerJournal of optoelectronics and advanced materials2009 / 10, p. 1490-1493 https://www.researchgate.net/publication/286966891_Structural_investigations_of_ion_beam_synthesized_b-FeSi2

journal article

Thermal annealing of sequentially deposited SnS thin filmsSafonova, Maria; Nair, Padmanabhan Pankajakshy Karunakaran; Mellikov, Enn; Aragon, Rebeca; Kerm, Karin; Naidu, Revathi; Mikli, Valdek; Volobujeva, OlgaProceedings of the Estonian Academy of Sciences2015 / p. 488-494 : ill http://dx.doi.org/10.3176/proc.2015.4.04

journal article

vaste

sort

aatomjõumikroskoopia (subject term)

types of item

subject term 1