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Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programs

author
statement of authorship
F. Pellerey, M. Jenihhin, G. Squillero, J. Raik, M. Sonza Reorda, V. Tihhomirov, R. Ubar
source
2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan
location of publication
Los Alamitos
publisher
year of publication
pages
p. 304-309 : ill
conference name, date
25th Asian Test Symposium, 21-24 November, 2016
conference location
Hiroshima, Japan
url
ISSN
2377-5386
ISBN
978-1-5090-3808-4
notes
Bibliogr.: 37 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
Pellerey, F., Jenihhin, M., Squillero, G., Raik, J., Sonza Reorda, M., Tihhomirov, V., Ubar, R. Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programs // 2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan. Los Alamitos : IEEE, 2016. p. 304-309 : ill. https://doi.org/10.1109/ATS.2016.57