From online fault detection to fault management in network-on-chips : a ground-up approach
author
statement of authorship
Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Nevin George, Adeboye Stephen Oyeniran, Tsotne Putkaradze, Apneet Kaur, Jaan Raik, Gert Jervan, Raimund Ubar, Thomas Hollstein
source
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
location of publication
Piscataway
publisher
year of publication
pages
p. 48-53 : ill
conference name, date
20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, April 19-21, 2017
conference location
Dresden, Germany
subject term
subject of form
keyword
fault classification
reconfiguration
ISSN
2473-2117
ISBN
978-1-5386-0471-7
notes
Bibliogr.: 35 ref
TTÜ department
language
inglise
Azad, S.P., Niazmand, B., Janson, K., Nevin, G., Putkaradze, T., Oyeniran, A.S., - Apneet Kaur, Raik, J., Jervan, G., Ubar, R., Hollstein, T. From online fault detection to fault management in network-on-chips : a ground-up approach // Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany. Piscataway : IEEE, 2017. p. 48-53 : ill.