Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters
statement of authorship
A. Sangwongwanich, D. Zhou, E. Liivik, F. Blaabjerg
source
journal volume number month
vol. 88–90
year of publication
pages
p. 1003-1007
ISSN
0026-2714
notes
Bibliogr.: 18 ref
language
inglise
subject term
keyword
reliability prediction
sampling rate
TTÜ department
Sangwongwanich, A., Zhou, D., Liivik, E., Blaabjerg, F. Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters // Microelectronics reliability (2018) vol. 88–90, p. 1003-1007.