Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuits
statement of authorship
Kõusaar, Jaak; Ubar, Raimund; Kostin, Sergei; Devadze, Sergei; Raik Jaan
journal volume number month
vol. 9, 1
year of publication
pages
p. 9−18
url
ISSN
2080-8755
notes
Bibliogr.: 18 ref
language
inglise
keyword
TTÜ department
Kõusaar, J., Ubar, R.-J., Kostin, S., Devadze, S., Raik, J. Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuits // International journal of microelectronics and computer science (2018) vol. 9, 1, p. 9−18.