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Ways for board and system test to benefit from FPGA embedded instrumentation

author
statement of authorship
Heiko Ehrenberg, Sergei Odintsov, Sergei Devadze, Artur Jutman, Igor Aleksejev, Thomas Wenzel
source
2019 IEEE AUTOTESTCON
location of publication
[S.l.]
publisher
year of publication
pages
10 p : ill
conference name, date
2019 IEEE AUTOTESTCON, 26-29 Aug. 2019
conference location
National Harbor, MD, USA
url
ISSN
1558-4550
1088-7725
ISBN
978-1-7281-2832-0
978-1-7281-2833-7
notes
Bibliogr.: 13 ref
TTÜ department
language
inglise
subject term
keyword
FPGA
FPGA-Embedded Instrument
FPGA-Assisted Test
Board and System Test
JTAG / boundary scan
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Ehrenberg, H., Odintsov, S., Devadze, S., Jutman, A., Aleksejev, I., Wenzel, T. Ways for board and system test to benefit from FPGA embedded instrumentation // 2019 IEEE AUTOTESTCON. [S.l.] : IEEE, 2019. 10 p : ill. https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057