Representing gate-level SET faults by multiple SEU faults on RT-level
statement of authorship
Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer
source
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
location of publication
Danvers
publisher
year of publication
pages
art. 19889351, 6 p. : ill
conference name, date
IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020
conference location
Napoli, Italy
subject term
keyword
ISBN
9781728181875
notes
Bibliogr.: 20 ref
scientific publication
teaduspublikatsioon
classifier
TTÜ department
language
inglise
Bagbaba, A.C., Jenihhin, M., Ubar, R., Sauer, C. Representing gate-level SET faults by multiple SEU faults on RT-level // 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings. Danvers : IEEE, 2020. art. 19889351, 6 p. : ill.