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Design obfuscation versus test

author
Farahmandi, Farimah
Sinanoglu, Ozgur
Blanton, Ronald
Pagliarini, Samuel Nascimento
statement of authorship
Farimah Farahmandi, Ozgur Sinanoglu, Ronald Blanton, Samuel Pagliarini
source
2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia
location of publication
Danvers
publisher
year of publication
pages
10 p
conference name, date
2020 IEEE European Test Symposium (ETS), 25-29 May 2020
conference location
Tallinn, Estonia
url
ISBN
978-1-7281-4312-5
notes
Bibliogr.: 41 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
keyword
logic locking
logic obfuscation
integrated circuit design
test
automatic test pattern generation
high level synthesis
Reserch Group
Centre for hardware security
Farahmandi, F., Sinanoglu, O., Blanton, R., Pagliarini, S. Design obfuscation versus test // 2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia. Danvers : IEEE, 2020. 10 p. https://doi.org/10.1109/ETS48528.2020.9131590