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Latest trends in hardware security and privacyDi Natale, Giorgio; Regazzoni, Francesco; Albanese, Vincent; Lhermet, Frank; Loisel, Yann; Sensaoui, Abderrahmane; Pagliarini, Samuel Nascimento33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : ESA-ESRIN, Italy (On-line Virtual Event),October 19–21, 20202020 / 4 p. : ill https://doi.org/10.1109/DFT50435.2020.9250816

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Split-chip design to prevent IP reverse engineeringPagliarini, Samuel Nascimento; Sweeney, Joseph; Mai, Ken; Blanton, Shawn; Mitra, Subhasish; Pileggi, LarryIEEE Design and Test2020 / p. 109-118 https://doi.org/10.1109/MDAT.2020.3033255 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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