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Combining fault analysis technologies for ISO26262 functional safety verification

author
statement of authorship
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui and Christian Sauer
source
2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings
publisher
year of publication
pages
p. 129–134 : ill
conference name, date
2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019
conference location
Kolkata, India
url
ISSN
2377-5386
ISBN
978-1-7281-2695-1
notes
Bibliogr.: 13 ref
Open Access
Open Access (roheline)
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S., Sauer, C. Combining fault analysis technologies for ISO26262 functional safety verification // 2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings. : IEEE Computer Society, 2019. p. 129–134 : ill. https://doi.org/10.1109/ATS47505.2019.00024