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Electromagnetic fields in contemporary office workplacesKoppel, Tarmo; Tasa, T.; Tint, PiiaAgronomy research2013 / p. 421-434 : ill

journal article

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book article

On BTI aging rejuvenation in memory address decodersGürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said2022 IEEE 23rd Latin American Test Symposium, LATS 20222022 / Code 184360 https://doi.org/10.1109/LATS57337.2022.9936940

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book article

On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networksDamljanovic, Aleksa; Squillero, Giovanni; Gürsoy, Cemil Cem; Jenihhin, MaksimVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 335-340 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920313

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journal article EST / journal article ENG

Practical indicators for risk of airborne transmission in shared indoor environments and their application to COVID-19 outbreaksPeng, Zhang; Pineda Rojas, Andrea L.; Kropff, Emilio; Kurnitski, JarekEnvironmental science & technology2022 / p. 1125-1137 https://doi.org/10.1021/acs.est.1c06531 Journal metrics at Scopus Article at Scopus Journalmetrics at WOS Article at WOS

journal article EST / journal article ENG

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book article EST / book article ENG

Security risk management in the aviation turnaround sectorMatulevičius, Raimundas; Norta, Alexander; Udokwu, Chibuzor; Nõukas, ReinFuture Data and Security Engineering : Third International Conference, FDSE 2016, Can Tho City, Vietnam, November 23-25, 2016 : proceedings2016 / p. 119-140 : ill https://doi.org/10.1007/978-3-319-48057-2_8 Conference Proceedings at Scopus Article at Scopus Conference Proceedings at WOS Article at WOS

book article EST / book article ENG

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book article

Shielding inbound microwave electromagnetic radiationKoppel, Tarmo; Haldre, Heldur56th International Riga Technical University Conference "Scientific Conference on Economics and Entrepreneurship SCEE'2015" : proceedings2015 / p. 151-153 : tab

book article

7

book article

Software-based mitigation for memory address decoder agingKraak, D. H. P.; Gürsoy, Cemil Cem; Jenihhin, Maksim; Raik, JaanLATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 20192019 / 6 p. : ill https://doi.org/10.1109/LATW.2019.8704595

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