Searching - TalTech Research Portal

display

sort

1

book article

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

book article

2

book article

Digital design flow with test activitiesDiener, Karl-Heinz; Elst, G.; Ivask, Eero; Jervan, Gert; Peng, Z.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

book article

3

book article

FPGA design flow with automated test generationElst, G.; Diener, Karl-Heinz; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesProc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 19991999 / p. 120-123

book article

4

book article

High-level synthesis and test in the MOSCITO-based virtual laboratorySchneider, Andre; Diener, Karl-Heinz; Jervan, Gert; Peng, Z.; Raik, Jaan; Ubar, Raimund-Johannes; Hollstein, Thomas; Glesner, M.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 287-290 : ill

book article

5

book article

Integration of digital test tools to the internet-based environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, Günter; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesSCI 2003 : the 7th World Multiconference on Systemics, Cybernetics and Informatics : July 27-30, 2003, Orlando, Florida, USA : proceedings. Volume VIII, Applications of Informatics and Cybernetics in Science and Engineering2003 / p. 136-141 : ill

book article

6

book article

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM] https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF

book article

7

book article

Internet-based testability-driven test generation in the virtual environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, G.; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesInternational Federation for Information Processing IFIP : International Workshop on IP-Based SoC Design 2002 : proceedings : Grenoble, October 30-31, 20022002 / p. 357-362 : ill http://publica.fraunhofer.de/dokumente/N-287433.html

book article

8

book article

Virtual laboratory for research in dependable microelectronicsDiener, Karl-Heinz; Elst, G.; Gramatova, Elena; Kuzmicz, W.; Peng, Z.; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 217-220 : ill

book article

Diener, Karl-Heinz (author)

types of item

author 7

name of the person 2