Searching - TalTech Research Portal

display

sort

426

book article

Kõrgharidus on võime näha puude taga metsa : [kõne TTÜ 90. aastapäeva aktusel 17. septembril 2008 TTÜ aulas]Ubar, Raimund-JohannesTallinna Tehnikaülikool 90 : [artiklikogumik]2009 / lk. 50-55

book article

427

newspaper article

Kõrgharidus on võime näha puude taga metsa : [kõne TTÜ 90. aastapäeva pidulikul koosolekul 17. sept. 2008 TTÜ aulas]Ubar, Raimund-JohannesMente et Manu2008 / 26. sept., lk. 3 : fot https://www.ester.ee/record=b1242496*est

newspaper article

428

book article

Laboratory course for training "Digital design and test"Ubar, Raimund-Johannes; Tulit, Viljar; Buldas, Ahto; Saarepera, MärtFourth EUROCHIP Workshop on VLSI Design Training, 29 September to 1 October 1993, Toledo : [proceedings]1993 / p. 112-117: ill

book article

429

book article

Laboratory framework TEAM for investigating the dependability issues of microprocessor systemsJasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes; Kruus, Helena10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 80-83 : ill

book article

430

book article

Laboratory training for teaching design and test of digital circuitsJutman, Artur; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 521-524 : ill

book article

431

newspaper article

Lapik maa ja eestlased : Euroopa esinduskonverentsil DATE'99 [Design Automation and Test in Europe] MünchenisUbar, Raimund-JohannesTehnikaülikool1999 / 5. apr., lk. 4 https://www.ester.ee/record=b5309277*est

newspaper article

432

book article

Layout to logic defect analysis for hierarchical test generationJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Rakowski, MichalProceedings of the 2007 IEEE Workshop on Design and Diagnostic Circuits and Systems : April 11-13, 2007, Krakow, Poland2007 / p. 35-40 : ill http://dx.doi.org/10.1109/DDECS.2007.4295251

book article

433

journal article

Learning digital test and diagnostics via internetUbar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Orasson, Elmet; Devadze, Sergei; Wuttke, Heinz-DietrichInternational journal of online engineering2007 / 1, [9] p. : ill https://www.db-thueringen.de/servlets/MCRFileNodeServlet/dbt_derivate_00032681/iJOE_1681-1221_03_2007_1_361.pdf

journal article

434

journal article

Learning digital test and diagnostics via internet [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Orasson, Elmet; Devadze, Sergei; Wuttke, Heinz-DietrichInternational journal of computing & information sciences2006 / 2, p. 86-96 : ill

journal article

435

book article

LFSR polynomial and seed selection using genetic algorithmAleksejev, E.; Jutman, Artur; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 179-182 : ill

book article

436

journal article

Linear algorithms for recognizing and parsing superpositional graphsPeder, Ahti; Nestra, Härmel; Raik, Jaan; Tombak, Mati; Ubar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 325-339 : ill http://dx.doi.org/10.2298/FUEE1103325P

journal article

437

book article

Linear algorithms for testing superpositional graphsPeder, Ahti; Nestra, Härmel; Raik, Jaan; Tombak, Mati; Ubar, Raimund-JohannesProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 111-118 : ill

book article

438

book article

Localization of single-gate design errors in combinational circuits by diagnostic information about stuck-at faultsUbar, Raimund-Johannes; Borrione, DominiqueProceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 19981998 / p. 73-79

book article

439

book article

Logic simulation and fault collapsing with shared structurally synthesized BDDsMironov, Dmitri; Ubar, Raimund-Johannes; Raik, Jaan2014 19th IEEE European Test Symposium (ETS) : May 26th-30th, 2014, Paderborn, Germany : proceedings2014 / [2] p. : ill

book article

440

book article

Low-cost CAD software for teaching digital testUbar, Raimund-Johannes; Raik, Jaan; Paomets, PriiduFirst European Workshop on Microelectronics Education, Villard de Lans, France, February 5-6, 1996 : proceedings1996 / p. 48

book article

441

book article

Low-cost CAD system for teaching digital testUbar, Raimund-Johannes; Raik, Jaan; Paomets, Priidu; Ivask, Eero; Jervan, Gert; Markus, AnttiMicroelectronics education : proceedings of the European Workshop, Grenoble, France, 5-6 Feb 19961996 / p. 185-188

book article

442

book article

Lower bounds of the size of shared structurally synthesized BDDsUbar, Raimund-Johannes; Mironov, DmitriProceedings of the 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 23-25, 2014, Warsaw, Poland2014 / p. 77-82 : ill

book article

443

book article

Lühinägelik rahastamislahendusUbar, Raimund-JohannesTallinna Tehnikaülikooli aastaraamat 20022003 / lk. 125-127

book article

444

newspaper article

Lühinägelik rahastamislahendus : [Eesti valitsus võtmas suunda projektipõhisele investeerimisele]Ubar, Raimund-JohannesPostimees2002 / 17. mai, lk. 11 https://arvamus.postimees.ee/1939989/luhinagelik-rahastamislahendus

newspaper article

445

book article

Macro level defect-oriented diagnosability of digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 53-56 : ill

book article

446

book article

Macro level defect-oriented diagnosability of digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 149-152 : ill

book article

447

book article

Mapping faults in hierarchical testing of digital systemsUbar, Raimund-JohannesInternational Conference on Computer, Communication and Control Technologies CCCT'03 and the 9th International Conference on Information Systems, Analysis and Synthesis ISAS'03 : July 31 - August 1-2, Orlando, Florida, USA : proceedings. Volume I, Computing/Information Systems and Technologies2003 / p. 14-19 : ill

book article

448

book article

Mapping physical defects to logic level for defect oriented testingUbar, Raimund-JohannesSCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 22003 / p. 453-456 : ill https://ieeexplore.ieee.org/document/5731320

book article

449

book article

Measuring and identifying aging-critical paths in FPGAsPfeifer, Petr; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Pliva, ZdenekMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 56-61 : ill

book article

450

book article

A method for crosstalk fault detection in on-chip busesBengtsson, Tomas; Jutman, Artur; Ubar, Raimund-Johannes; Kumar, ShashiNorchip : proceedings : Oulu, Finland, 21-22 November 20052005 / p. 285-288 : ill https://doi.org/10.1109/NORCHP.2005.1597045

book article

types of item

author 56

CV 56

name of the person 27

subject term 1