Authors from search
types of item

  • book article
    High-level decision diagram simulation for diagnosis and soft-error analysisRaik, Jaan; Repinski, Urmas; Jenihhin, Maksim; Chepurov, AntonDesign and test technology for dependable systems-on-chip2011 / p. 294-309 : ill
    book article
Number of records 1, displaying 1 - 1