High-level decision diagram simulation for diagnosis and soft-error analysis
heading
Raik, J., Repinski, U., Jenihhin, M., Chepurov, A.
author
statement of authorship
Jaan Raik, Urmas Repinski, Maksim Jenihhin, Anton Chepurov
location of publication
Hershey
publisher
year of publication
pages
p. 294-309 : ill
ISBN
978-1-60960-212-3
notes
Bibliogr. p. 307-309
availibility
ei leidu TTÜ Raamatukogus
TTÜ department code
ia
country
us
language
inglise
report field
aastar2011i
etis2011
editor's notes
PUBL-v1-46341-kahro@lib.ttu.ee
Ed 050112
MTi 020924
Raik, J., Repinski, U., Jenihhin, M., Chepurov, A. High-level decision diagram simulation for diagnosis and soft-error analysis // Design and test technology for dependable systems-on-chip. Hershey : Information Science Reference, 2011. p. 294-309 : ill.