Raik, J., Repinski, U., Jenihhin, M., Chepurov, A.

High-level decision diagram simulation for diagnosis and soft-error analysis

author

Raik, Jaan

Repinski, Urmas

Jenihhin, Maksim

Chepurov, Anton

statement of authorship

Jaan Raik, Urmas Repinski, Maksim Jenihhin, Anton Chepurov

source

Design and test technology for dependable systems-on-chip

location of publication

Hershey

publisher

Information Science Reference

year of publication

2011

pages

p. 294-309 : ill

ISBN

978-1-60960-212-3

notes

Bibliogr. p. 307-309

language

inglise

Raik, J., Repinski, U., Jenihhin, M., Chepurov, A. High-level decision diagram simulation for diagnosis and soft-error analysis // Design and test technology for dependable systems-on-chip. Hershey : Information Science Reference, 2011. p. 294-309 : ill.