Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Tšertov, Anton (author)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
35
Look more..
(4/90)
Export
export all inquiry results
(35)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
A tool for advanced learning of LFSR-based testing principles
Jutman, Artur
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 175-178 : ill
book article
2
book article
A tool for teaching pseudo-random TPG principles
Jutman, Artur
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
Proceedings of the 17th EAEEIE Annual Conference on Innovation in Education for Electrical and Information Engineering : Craiova, Romania, June 1st-3rd, 2006
2006
/
p. 182-187 : ill
book article
3
journal article
Automated software-based in-field self-test program synthesis
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
International journal of microelectronics and computer science
2017
/
p. 57-64 : ill
journal article
4
book article
Automated software-based self-test generation for microprocessors
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
Proceedings of the 24st International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2017 : Bydgoszcz, Poland, June 19-21, 2014
2017
/
p. 453-458 : ill
https://doi.org/10.23919/MIXDES.2017.8005252
book article
5
book article
Automatic SoC level test path synthesis based on partial functional models
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
2011 Asian Test Symposium (ATS) : New Delhi, India
2011
/
p. 532-538
https://ieeexplore.ieee.org/document/6114730
book article
6
book article
Automation of testing beyond the SoCs
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 29-32 : ill
book article
7
book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
8
book article
Calculation of LFSR seed and polynomial pair for BIST applications
Jutman, Artur
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 105-108 : ill
book article
9
book article
Calculation of LFSR seed and polynomial pair for BIST applications [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
2008
/
p. 275-279 : ill. [CD-ROM]
book article
10
book article
E-learning environment for WEB-based study of testing
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Aleksejev, Igor
;
Tšepurov, Anton
;
Tšertov, Anton
;
Kostin, Sergei
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
Proceedings of the 8th European Workshop on Microelectronics Education : EWME 2010 : Darmstadt, Germany, 10-12 May 2010
2010
/
p. 47-52 : ill
book article
11
book article
Hardware/Software co-design in practice : MEMOCODE'08 contest experience
Reinsalu, Uljana
;
Devadze, Sergei
;
Jutman, Artur
;
Tšertov, Anton
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 55-58 : ill
book article
12
book article
High-level modeling and testing of multiple control faults in digital systems
Jasnetski, Artjom
;
Oyeniran, Adeboye Stephen
;
Tšertov, Anton
;
Schölzel, Mario
;
Ubar, Raimund-Johannes
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/DDECS.2016.7482445
book article
13
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
14
book article
IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoring
Tšertov, Anton
;
Jutman, Artur
;
Shibin, Konstantin
;
Devadze, Sergei
IEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings
2018
/
9 p.: ill
https://doi.org/10.1109/AUTEST.2018.8532559
book article
15
journal article
In-system programming of non-volatile memories on microprocessor-centric boards
Tšertov, Anton
;
Devadze, Sergei
;
Jutman, Artur
;
Jasnetski, Artjom
International journal of microelectronics and computer science
2014
/
p. 25-34 : ill
journal article
16
book article
Laboratory framework TEAM for investigating the dependability issues of microprocessor systems
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Kruus, Helena
10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia
2014
/
p. 80-83 : ill
book article
17
book article
Microprocessor modeling for board level test access automation
Devadze, Sergei
;
Jutman, Artur
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
Proceedings of 10th IEEE Workshop on RTL and High Level Testing : Hong Kong, November 27-28, 2009
2009
/
? p
book article
18
book article
Microprocessor-based system test using debug interface
Devadze, Sergei
;
Jutman, Artur
;
Tšertov, Anton
;
Instenberg, Martin
;
Ubar, Raimund-Johannes
26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings
2008
/
p. 98-101 : ill
http://dx.doi.org/10.1109/NORCHP.2008.4738291
book article
19
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
20
book article
On automatic software-based self-test program generation based on high-Level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 177
http://dx.doi.org/10.1109/LATW.2016.7483357
book article
21
journal article
On in-system programming of non-volatile memories
Tšertov, Anton
;
Devadze, Sergei
;
Jutman, Artur
;
Jasnetski, Artjom
International journal of microelectronics and computer science
2013
/
p. 72-78 : ill
journal article
22
book article
On in-system programming of non-volatile memories
Tšertov, Anton
;
Devadze, Sergei
;
Jutman, Artur
;
Jasnetski, Artjom
Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2013, Gdynia, Poland, June 20-22, 2013
2013
/
p. 408-413 : ill
book article
23
book article
Post-silicon validation of IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Jutman, Artur
;
Squillero, Giovanni
;
Tšertov, Anton
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791546
book article
24
book article EST
/
book article ENG
Preface
Hollstein, Thomas
;
Raik, Jaan
;
Kostin, Sergei
;
Tšertov, Anton
;
O’Connor, Ian
;
Reis, Ricardo
VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016 : Revised Selected Papers
2017
/
p. V-VI
https://link.springer.com/book/10.1007/978-3-319-67104-8
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
25
book article
Simulation-based equivalence checking between IEEE 1687 ICL and RTL
Damljanovic, Aleksa
;
Jutman, Artur
;
Portolan, Michele
;
Tšertov, Anton
2019 IEEE International Test Conference (ITC)
2019
/
paper. 7.3, 8 p. : ill
https://doi.org/10.1109/ITC44170.2019.9000181
book article
Number of records 35, displaying
1 - 25
previous
1
2
next
author
53
1.
Tšertov, Anton
2.
Tsertov, Anton
3.
Aleksejev, Anton
4.
Anisimov, Anton S.
5.
Anton, Arvo
6.
Anton, Christian
7.
Anton, Dea
8.
Anton, E.
9.
Anton, Eha
10.
Anton, Gaspar
11.
Anton, Grete
12.
Anton, H.
13.
Anton, Johan
14.
Anton, K.
15.
Anton, Lauri
16.
Anton, Maia-Liisa
17.
Anton, Mart
18.
Anton, Riina
19.
Anton, Riivo
20.
Arhipov, Anton
21.
Bergant, Anton
22.
Bogdanov, Anton
23.
Charnamord, Anton
24.
Chepurov, Anton
25.
Dijev, Anton
26.
Dmitrijev, Anton
27.
Hansson, Anton
28.
Hromov, Anton
29.
Jürisson, Anton
30.
Karputkin, Anton
31.
Keks, Anton
32.
Kott, Anton
33.
Kurakin, Anton
34.
Kuzmin, Anton V.
35.
Kuznetsov, Anton
36.
Kutser, Anton
37.
Laur, Anton
38.
Malmi, Anton
39.
Mastitski, Anton
40.
Pashkevich, Anton
41.
Potapov, Anton M.
42.
Rassõlkin, Anton
43.
Rutkovski, Anton
44.
Savitš, Anton
45.
Shalygin, Anton S.
46.
Smirnov, Anton
47.
Sokolov, Anton
48.
Terasmaa, Anton
49.
Timofejev, Anton
50.
Trnik, Anton
51.
Tšepurov, Anton
52.
Vedešin, Anton
53.
Verchenko, Anton
CV
21
1.
Tšertov, Anton
2.
Tsertov, Anton
3.
Anton, Johan
4.
Anton, Mart
5.
Anton, Riina
6.
Arhipov, Anton
7.
Bogdanov, Anton 1916-1960
8.
Jürisson, Anton 1919-2001
9.
Kesküla, Anton
10.
Kutser, Anton
11.
Laur, Anton 1906-1989
12.
Laur, Anton
13.
Pashkevich, Anton
14.
Rassõlkin, Anton
15.
Soans, Anton Lembit 1885-1966
16.
Tammert, Anton 1902-1980
17.
Tammert, Anton Baldwin
18.
Tramberg, Anton
19.
Trampärk, Anton
20.
Uesson, Anton 1879-1942
21.
Vedešin, Anton
name of the person
15
1.
Tšertov, Anton
2.
Anton, Johan
3.
Anton, Maia-Liisa
4.
Anton, Mart, 1979-
5.
Bogdanov, Anton
6.
Karputkin, Anton
7.
Keks, Anton
8.
Rassõlkin, Anton, 1985-
9.
Savitš, Anton
10.
Soans, Anton, 1885-1966
11.
Zeilinger, Anton, 1945-
12.
Tšepurov, Anton
13.
Uesson, Anton, 1879-1942
14.
Vedešin, Anton
15.
Üksti, Anton
subject term
1
1.
Anton Heilmann, kaubanduse ja tööstuse aktsiaselts
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT