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nanoelektroonika (subject term)
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1
book article
Automated area and coverage optimization of minimal latency checkers
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Apneet Kaur
;
Raik, Jaan
;
Jervan, Gert
;
Hollstein, Thomas
2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings
2017
/
p. 7-8 : ill
https://doi.org/10.1109/ETS.2017.7968211
book article
2
book article
Automated correction of design errors by edge redirection on high-level decision diagrams
Karputkin, Anton
;
Ubar, Raimund-Johannes
;
Tombak, Mati
;
Raik, Jaan
13th International Symposium on Quality Electronic Design (ISQED), 2012
2012
/
p. 686-693 : ill
https://ieeexplore.ieee.org/document/6113980
book article
3
book article
FP7 collaborative research project DIAMOND : diagnosis, error modeling and correction for reliable systems design
Raik, Jaan
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p
https://ieeexplore.ieee.org/document/6233052
book article
4
book
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
https://www.ester.ee/record=b2055139*est
book
5
book article
Interactive presentation abstract : automated correction of design errors by edge redirection on high-level decision diagrams [Electronic resource]
Karputkin, Anton
;
Ubar, Raimund-Johannes
;
Tombak, Mati
;
Raik, Jaan
IEEE International High Level Design Validation and Test Workshop (HLDVT'11), November 9-11, 2011, Napa Valley, CA
2011
/
p. 83 : ill. [CD-ROM]
http://doi.ieeecomputersociety.org/10.1109/HLDVT.2011.6113980
book article
6
newspaper article
Mikroelektroonika on muutumas nanoelektroonikaks
Krustok, Jüri
Eesti Päevaleht
1996
/
24. apr., lk. 7
newspaper article
7
book article
Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensors
Ubar, Raimund-Johannes
;
Vargas, Fabian
;
Jenihhin, Maksim
;
Raik, Jaan
MEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 2013
2013
/
[1] p
book article
8
book article
On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Squillero, Giovanni
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 335-340 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920313
book article
9
book article
RESCUE : cross-sectoral PhD training concept for interdependent reliability, security and quality
Vierhaus, Heinrich Theodor
;
Jenihhin, Maksim
;
Sonza Reorda, Matteo
2018 12th European Workshop on Microelectronics Education (EWME) : September 24–26, 2018
2018
/
p. 45-50 : ill
https://doi.org/10.1109/EWME.2018.8629465
book article
10
book article
RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems design
Gürsoy, Cemil Cem
;
Cardoso Medeiros, Guilherme
;
Chen, Juanho
;
Balakrishnan, Aneesh
;
Lai, Xinhui
;
Bagbaba, Ahmet Cagri
;
Raik, Jaan
;
Jenihhin, Maksim
DATE 2019
2019
/
1 p. : ill
https://doi.org/10.5281/zenodo.3362529
https://past.date-conference.com/
book article
11
journal article EST
/
journal article ENG
Simulations of propane and butane gas sensor based on pristine armchair graphene nanoribbon
Rashid, Muhammad Haroon
;
Koel, Ants
;
Rang, Toomas
IOP conference series : materials science and engineering
2018
/
art. 012001, 8 p
https://doi.org/10.1088/1757-899X/362/1/012001
Conference proceedings at Scopus
Article at Scopus
Article at WOS
journal article EST
/
journal article ENG
12
book
Special issue "Advanced hardware implementations for IoT systems and applications"
2022
https://www.mdpi.com/journal/electronics/special_issues/Hardware_IoT
book
13
journal article
System-level communication synthesis and dependability improvements for Network-on-Chip based systems
Tagel, Mihkel
;
Ellervee, Peeter
;
Jervan, Gert
Estonian journal of engineering
2010
/
1, p. 23-38 : ill
https://artiklid.elnet.ee/record=b1964968*est
journal article
14
book article
Universal mitigation of NBTI-induced aging by design randomization
Jenihhin, Maksim
;
Kamkin, Alexander
;
Navabi, Zainalabedin
;
Sadeghi-Kohan, Somayeh
Proceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 2016
2017
/
[5] p. : ill
http://dx.doi.org/10.1109/EWDTS.2016.7807635
book article
Number of records 14, displaying
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nanoelektroonika
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