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Automated area and coverage optimization of minimal latency checkersAzad, Siavoosh Payandeh; Niazmand, Behrad; Apneet Kaur; Raik, Jaan; Jervan, Gert; Hollstein, Thomas2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings2017 / p. 7-8 : ill https://doi.org/10.1109/ETS.2017.7968211

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Automated correction of design errors by edge redirection on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, Jaan13th International Symposium on Quality Electronic Design (ISQED), 20122012 / p. 686-693 : ill https://ieeexplore.ieee.org/document/6113980

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FP7 collaborative research project DIAMOND : diagnosis, error modeling and correction for reliable systems designRaik, JaanProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p https://ieeexplore.ieee.org/document/6233052

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Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 https://www.ester.ee/record=b2055139*est

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Interactive presentation abstract : automated correction of design errors by edge redirection on high-level decision diagrams [Electronic resource]Karputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, JaanIEEE International High Level Design Validation and Test Workshop (HLDVT'11), November 9-11, 2011, Napa Valley, CA2011 / p. 83 : ill. [CD-ROM] http://doi.ieeecomputersociety.org/10.1109/HLDVT.2011.6113980

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newspaper article

Mikroelektroonika on muutumas nanoelektroonikaksKrustok, JüriEesti Päevaleht1996 / 24. apr., lk. 7

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book article

Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensorsUbar, Raimund-Johannes; Vargas, Fabian; Jenihhin, Maksim; Raik, JaanMEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 20132013 / [1] p

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On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networksDamljanovic, Aleksa; Squillero, Giovanni; Gürsoy, Cemil Cem; Jenihhin, MaksimVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 335-340 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920313

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RESCUE : cross-sectoral PhD training concept for interdependent reliability, security and qualityVierhaus, Heinrich Theodor; Jenihhin, Maksim; Sonza Reorda, Matteo2018 12th European Workshop on Microelectronics Education (EWME) : September 24–26, 20182018 / p. 45-50 : ill https://doi.org/10.1109/EWME.2018.8629465

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RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

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journal article EST / journal article ENG

Simulations of propane and butane gas sensor based on pristine armchair graphene nanoribbonRashid, Muhammad Haroon; Koel, Ants; Rang, ToomasIOP conference series : materials science and engineering2018 / art. 012001, 8 p https://doi.org/10.1088/1757-899X/362/1/012001 Conference proceedings at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG

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Special issue "Advanced hardware implementations for IoT systems and applications"2022 https://www.mdpi.com/journal/electronics/special_issues/Hardware_IoT

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journal article

System-level communication synthesis and dependability improvements for Network-on-Chip based systemsTagel, Mihkel; Ellervee, Peeter; Jervan, GertEstonian journal of engineering2010 / 1, p. 23-38 : ill https://artiklid.elnet.ee/record=b1964968*est

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Universal mitigation of NBTI-induced aging by design randomizationJenihhin, Maksim; Kamkin, Alexander; Navabi, Zainalabedin; Sadeghi-Kohan, SomayehProceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 20162017 / [5] p. : ill http://dx.doi.org/10.1109/EWDTS.2016.7807635

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nanoelektroonika (subject term)

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