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Automated area and coverage optimization of minimal latency checkers (title)
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book article
Automated area and coverage optimization of minimal latency checkers
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Apneet Kaur
;
Raik, Jaan
;
Jervan, Gert
;
Hollstein, Thomas
2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings
2017
/
p. 7-8 : ill
https://doi.org/10.1109/ETS.2017.7968211
book article
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