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BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1 (source)
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1
book article
A global methodology for test program generation starting from high level specifications
Storojev, Sergei
;
Leveugle, Regis
;
Saucier, Gabriele
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 305-311: ill
https://www.ester.ee/record=b2150914*est
book article
2
book article
A trap detector for precise measurements of optical radiation power
Kübarsepp, Toomas
;
Kärhä, Petri
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 195-200: ill
book article
3
book article
Actual research topics in mechatronics system design
Glesner, M.
;
Herpel, H.-J.
;
Kirschbaum, A.
;
Windirsch, P.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 85-91: ill
book article
4
book article
Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systems
Ubar, Raimund-Johannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 285-292: ill
book article
5
book article
An approach to model development for embedded testing
Timohovich, E.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 353-358
book article
6
book article
An interesting and effective code for error-correcting in mass-storage devices
Szepessy, Andras
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 331-337
book article
7
book article
Assurance of gain stability of spaceborne teleradiometers
Veismann, Uno
;
Min, Mart
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 179-185: ill
book article
8
book article
A CAD system for teaching digital test
Ubar, Raimund-Johannes
;
Ivask, Eero
;
Paomets, Priidu
;
Raik, Jaan
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 369-372: ill
book article
9
book article
Chaos in electronic circuits
Lindberg, Erik
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 29-37: ill
book article
10
book article
Complementary Darlington circuit
Männama, Vello
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 223-228: ill
book article
11
book article
Constraints analysis in hierarchical test generation for digital systems
Ubar, Raimund-Johannes
;
Krupnova, Helena
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 313-318: ill
book article
12
book article
Design and application of lock-in instruments
Min, Mart
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 95-104: ill
book article
13
book article
Different ways for optimization of settling time of the 3rd order phase locked loop
Tammemägi, Jaak
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 239-243: ill
book article
14
book article
Direct sequence spread spectrum digital radio
Kerek, Daniel
;
Saluvere, Teet
;
Tenhunen, Hannu
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 159-167: ill
book article
15
book article
Elektrodenübergangsimpedanz bei bioelektrischen Messungen
Märtin, Hannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
S. 147-150: Ill
book article
16
book article
Elements of noise modeling in bipolar semiconductor devices
Blum, Alfons
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 11-27
book article
17
book article
Experimental study of ultrasonic microprocessor - based heat meters
Ragauskas, A.
;
Pamakstis, V.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 141-145: ill
book article
18
book article
Fault aliasing of signature analyzers
Kemnitz, Günter
;
Kärger, Reinhard
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 339-346: ill
book article
19
book article
Hierarchical test generation for finite state machines
Brik, Marina
;
Ubar, Raimund-Johannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 319-324: ill
book article
20
book article
Identification of signal's sine-wave dominants using analysis of level crossings
Ronk, Ants
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 233-238: ill
book article
21
book article
Infared and near-infared Fourier spectrometer PFS 2000 for analytical research
Tõnnisson, T.
;
Lipping, Kalle
;
Pelt, Jaan
;
Raadi, G.
;
Randmets, R.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 169-172
book article
22
book article
Information techniques for sensor- and microsystems
Holmer, R.
;
Tränkler, Hans-Rolf
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 39-50: ill
book article
23
book article
Intelligence system for design and investigation mechanical values sensors
Shmakov, E.M.
;
Matveev, V.A.
;
Molotkov, S.V.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 261-269: ill
book article
24
book article
Intelligent diagnostic centers: a new way to distributed fault-tolerance
Varkonyi-Koczy, Annamaria R.
;
Tilly, K.
;
Dobrowiecki, Tadeusz
;
Vadasz, B.
;
Kiss, I.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 365-368: ill
book article
25
book article
Low-noise CMOS-charge amplifier for a silicon strip detector
Grönlund, Marko
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 217-222: ill
book article
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18th Biennial Baltic Electronics Conference (BEC) 2022
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