print

Hierarchical test generation for finite state machines

author
Brik, Marina
Ubar, Raimund-Johannes
statement of authorship
M.Brik, R.Ubar
source
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
location of publication
Tallinn
year of publication
1994
pages
p. 319-324: ill
subject term
testimine
graafid
VLSI-ahelad
ISBN
9985-59-012-0
notes
Bibl. 10 ref
language
inglise
Brik, M., Ubar, R. Hierarchical test generation for finite state machines // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 319-324: ill.