Brik, M., Ubar, R. - TalTech Research Portal

Hierarchical test generation for finite state machines

author

Brik, Marina

Ubar, Raimund-Johannes

statement of authorship

M.Brik, R.Ubar

source

BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1

location of publication

Tallinn

year of publication

1994

pages

p. 319-324: ill

ISBN

9985-59-012-0

notes

Bibl. 10 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

testimine

graafid

VLSI-ahelad

Brik, M., Ubar, R. Hierarchical test generation for finite state machines // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 319-324: ill.