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IEEE 1687 (keyword)
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1
book article
BASTION : board and SoC test instrumentation for ageing and no failure found
Jutman, Artur
;
Lotz, Christophe
;
Larsson, Erik
;
Sonza Reorda, Matteo
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland
2017
/
p. 115-120 : ill
https://doi.org/10.23919/DATE.2017.7926968
book article
2
journal article EST
/
journal article ENG
Health management for self-aware SoCs based on IEEE 1687 infrastructure
Shibin, Konstantin
;
Devadze, Sergei
;
Jutman, Artur
;
Grabmann, Martin
;
Pricken, Robin
IEEE Design & Test
2017
/
p. 27-35 : ill
https://doi.org/10.1109/MDAT.2017.2750902
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
3
book article
IEEE P1687 IJTAG demonstrator on FPGA
Shibin, Konstantin
;
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
DATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 2012
2012
/
1 p. : ill
book article
4
book article
Invited paper: System-Wide Fault Management based on IEEE P1687 IJTAG
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Jevgeni
6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) : 20-22 June 2011, Montpeillier, France
2011
/
[4] p.: ill
https://ieeexplore.ieee.org/document/5981520
book article
5
book article
Post-silicon validation of IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Jutman, Artur
;
Squillero, Giovanni
;
Tšertov, Anton
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791546
book article
6
book article
Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687
Jutman, Artur
;
Shibin, Konstantin
;
Devadze, Sergei
IEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings
2016
/
p. 240-249 : ill
https://doi.org/10.1109/AUTEST.2016.7589605
book article
7
book article
Simulation-based equivalence checking between IEEE 1687 ICL and RTL
Damljanovic, Aleksa
;
Jutman, Artur
;
Portolan, Michele
;
Tšertov, Anton
2019 IEEE International Test Conference (ITC)
2019
/
paper. 7.3, 8 p. : ill
https://doi.org/10.1109/ITC44170.2019.9000181
book article
8
book article
A suite of IEEE 1687 benchmark networks
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
2016 IEEE International Test Conference (ITC) : proceedings
2016
/
art. 6.1, p. 1-10 : ill
https://doi.org/10.1109/TEST.2016.7805840
book article
9
book article
System-wide fault management based on IEEE P1687 IJTAG
Shibin, Konstantin
;
Jutman, Artur
;
Devadze, Sergei
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa
2012
/
p. 81-84 : ill
book article
Number of records 9, displaying
1 - 9
keyword
9
1.
IEEE 1687
2.
IEEE Std. 1687
3.
IEEE P1687
4.
IEEE 1149.1
5.
IEEE 802.15.6
6.
IEEE 802156
7.
IEEE 9 bus test system
8.
IEEE C37.118.1
9.
24th IEEE International Conference on Industrial Technology 2023
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1.
IEEE
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1
1.
IEEE
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