Post-silicon validation of IEEE 1687 reconfigurable scan networks
statement of authorship
Aleksa Damljanovic, Artur Jutman, Giovanni Squillero, Anton Tsertov
location of publication
Danvers
publisher
year of publication
pages
6 p. : ill
conference name, date
2019 IEEE European Test Symposium ETS 2019, May 27 - 31, 2019
conference location
Baden Baden, Germany
ISSN
1558-1780
1530-1877
ISBN
978-1-7281-1173-5
978-1-7281-1174-2
notes
Bibliogr.: 14 ref
TTÜ department
language
inglise
Damljanovic, A., Jutman, A., Squillero, G., Tšertov, A. Post-silicon validation of IEEE 1687 reconfigurable scan networks // 2019 IEEE European Test Symposium (ETS) : proceedings. Danvers : IEEE, 2019. 6 p. : ill.