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High speed data preprocessing for bioimpedance measurements : architectural explorationEllervee, Peeter; Annus, Paul; Min, MartThe 27th NORCHIP Conference : Trondheim, Norway, November 20092009 / [4] p https://ieeexplore.ieee.org/document/5397838

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927

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High voltage GaAs diode stacks : the choice of epistructures for assemblingRang, Toomas; Voitovitš, Viktor; Kuznetsova, NataljaDesign, Test, Integration and Packaging of MEMS/MOEMS - DTIP2004 : 12-14 May 2004, Montreux, Switzerland2004 / p. 199-202 : ill

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928

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High-accuracy eddy current measurements of metalsMärtens, Olev; Land, Raul; Rist, Marek; Pokatilov, Andrei2014 IEEE International Workshop On Metrology For Aerospace : May 29-30, 2014, Benevento, Italy : proceedings2014 / p. 155-160 : ill

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929

journal article

High-efficiency partial power converter for integration of second-life battery energy storage systems in DC microgridsHassanpour, Naser; Chub, Andrii; Yadav, Neelesh; Blinov, Andrei; Vinnikov, DmitriIEEE Open Journal of the Industrial Electronics Society2024 / 15 p https://doi.org/10.1109/OJIES.2024.3389466

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930

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High-efficiency quad-mode parallel PV power optimizer for DC microgridsSidorov, Vadim; Chub, Andrii; Vinnikov, DmitriIEEE transactions on industry applications2023 / p. 1002-1012 https://doi.org/10.1109/TIA.2022.3208879

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931

journal article EST / journal article ENG

High-efficiency single-stage onboard charger for electrical vehiclesZinchenko, Denys; Blinov, Andrei; Chub, Andrii; Vinnikov, Dmitri; Verbytskyi, Ievgen; Bayhan, SertacIEEE Transactions on Vehicular Technology2021 / p. 12581-12592 : ill https://doi.org/10.1109/TVT.2021.3118392 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

932

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High-frequency split-bobbin transformer design with adjustable leakage inductanceRahman, Showrov; Sidorov, Vadim; Chub, Andrii; Vinnikov, Dmitri2021 IEEE 62nd International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), 15-17 Nov. 2021 : conference proceedings2021 / p. 1-5 : ill https://doi.org/10.1109/RTUCON53541.2021.9711708

book article

Seotud publikatsioonid 1

Universal galvanically isolated DC-DC converters with topology morphing control = Universaalsed topoloogiat muutva juhtimisega galvaaniliselt isoleeritud alalispingemuundurid

933

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High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

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934

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High-level combined deterministic and pseudo-exhuastive test generation for RISC processorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

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935

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High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

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936

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High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

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937

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High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

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938

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High-level intellectual property obfuscation via decoy constantsAksoy, Levent; Nguyen, Quang-Linh; Almeida, Felipe; Raik, Jaan; Flottes, Marie-Lise; Dupuis, Sophie; Pagliarini, Samuel Nascimento2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 20212021 / p. 1-7 https://doi.org/10.1109/IOLTS52814.2021.9486714

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939

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High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

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940

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High-level synthesis of control and memory intensive communication systemsEllervee, PeeterEighth Annual IEEE International ASIC Conference and Exhibit : proceedings : Stouffer Renaissance Austin Hotel, Austin, Texas, September 18-22, 19951995 / p. 185-191 : ill

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941

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High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

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942

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High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

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943

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High-level test synthesis with hierarchical test generationJervan, Gert; Eles, Petru; Peng, Zebo; Raik, Jaan; Ubar, Raimund-Johannes17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings1999 / p. 291-296

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944

journal article EST / journal article ENG

High-performance buck-boost partial power quasi-Z-source series resonance converterAbdel-Rahim, Omar; Chub, Andrii; Mashinchi Maheri, Hamed; Blinov, Andrei; Vinnikov, DmitriIEEE Access2022 / p. 13017-130189 https://doi.org/10.1109/ACCESS.2022.3225751 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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945

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High-performance hardware accelerators for sorting and managing prioritiesSklyarov, Valery; Skliarova, Iouliia; Mihhailov, Dmitri; Sudnitsõn, AleksanderProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 313-318 : ill

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946

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A High-performance open-source finite element analysis library for magnetics in MATLABLehikoinen, Antti; Davidsson, T.; Arkkio, Antero; Belahcen, Anouar2018 XIII International Conference on Electrical Machines (ICEM 2018) : Alexandroupoli, Greece, 3-6 September 20182018 / p. 486–492 : ill http://doi.org/10.1109/ICELMACH.2018.8507235

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947

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High-speed design of postquantum cryptography with optimized hashing and multiplicationImran, Malik; Aikata, Aikata; Roy, Sujoy Sinha; Pagliarini, Samuel NascimentoIEEE Transactions on Circuits and Systems II : Express Briefs2023 / p. 847-851 : ill https://doi.org//10.1109/TCSII.2023.3273821

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Seotud publikatsioonid 1

Hardware realization of lattice-based post-quantum cryptography = Võrel põhinev post-kvant-krüptograafia riistvaraline realisatsioon

948

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High-voltage auxiliary power supply with the simplified power circuit topology for the DC trains [Electronic resource]Vinnikov, Dmitri; Laugis, JuhanProceedings of the 9th International Conference "Electrical Power Quality and Utilisation" : EPQU'2007 : Barcelona, Spain, October 9-11, 20072007 / [6] p. [CD-ROM] https://ieeexplore.ieee.org/document/4424227

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949

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Higuchi fractal dimension and spectral entropy as measures of depth of sedation in intensive care unitAnier, Andres; Lipping, Tarmo; Melto, S.; Hovilehto, S.Proceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society : San Francisco, CA, USA, September 1-5, 2004. Vol. 12004 / p. 526-529 : ill https://pubmed.ncbi.nlm.nih.gov/17271729/

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950

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Hilbert transform, an effective replacement of Park's vector modulus for the detection of rotor faultsAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, Anouar2019 Electric Power Quality and Supply Reliability Conference (PQ) & 2019 Symposium on Electrical Engineering and Mechatronics (SEEM), Kärdla, Estonia, June 12-15, 2019 : proceedings2019 / 4 p. : ill https://doi.org/10.1109/PQ.2019.8818227

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IEEE (publisher)

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