Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
IEEE (publisher)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2248
Look more..
(3/11)
Export
export all inquiry results
(1000*)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1001
book article
High-level combined deterministic and pseudo-exhuastive test generation for RISC processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
book article
1002
book article
High-level decision diagrams based coverage metrics for verification and test
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
2009
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2009.4813792
book article
1003
book article
High-level design error diagnosis using backtrace on decision diagrams
Raik, Jaan
;
Repinski, Urmas
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
2010
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2010.5669486
book article
1004
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
1005
book article
High-level intellectual property obfuscation via decoy constants
Aksoy, Levent
;
Nguyen, Quang-Linh
;
Almeida, Felipe
;
Raik, Jaan
;
Flottes, Marie-Lise
;
Dupuis, Sophie
;
Pagliarini, Samuel Nascimento
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 2021
2021
/
p. 1-7
https://doi.org/10.1109/IOLTS52814.2021.9486714
book article
1006
book article
High-level modeling and testing of multiple control faults in digital systems
Jasnetski, Artjom
;
Oyeniran, Adeboye Stephen
;
Tšertov, Anton
;
Schölzel, Mario
;
Ubar, Raimund-Johannes
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/DDECS.2016.7482445
book article
1007
book article
High-level synthesis of control and memory intensive communication systems
Ellervee, Peeter
Eighth Annual IEEE International ASIC Conference and Exhibit : proceedings : Stouffer Renaissance Austin Hotel, Austin, Texas, September 18-22, 1995
1995
/
p. 185-191 : ill
book article
1008
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
1009
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
1010
book article
High-level test synthesis with hierarchical test generation
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Raik, Jaan
;
Ubar, Raimund-Johannes
17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings
1999
/
p. 291-296
book article
1011
journal article EST
/
journal article ENG
High-performance buck-boost partial power quasi-Z-source series resonance converter
Abdel-Rahim, Omar
;
Chub, Andrii
;
Mashinchi Maheri, Hamed
;
Blinov, Andrei
;
Vinnikov, Dmitri
IEEE Access
2022
/
p. 13017-130189
https://doi.org/10.1109/ACCESS.2022.3225751
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
1012
book article
High-performance hardware accelerators for sorting and managing priorities
Sklyarov, Valery
;
Skliarova, Iouliia
;
Mihhailov, Dmitri
;
Sudnitsõn, Aleksander
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
2011
/
p. 313-318 : ill
book article
1013
book article
A High-performance open-source finite element analysis library for magnetics in MATLAB
Lehikoinen, Antti
;
Davidsson, T.
;
Arkkio, Antero
;
Belahcen, Anouar
2018 XIII International Conference on Electrical Machines (ICEM 2018) : Alexandroupoli, Greece, 3-6 September 2018
2018
/
p. 486–492 : ill
http://doi.org/10.1109/ICELMACH.2018.8507235
book article
1014
journal article EST
/
journal article ENG
High-performance quasi-Z-source series resonant DC-DC converter for photovoltaic module-level power electronics applications
Vinnikov, Dmitri
;
Chub, Andrii
;
Liivik, Elizaveta
;
Roasto, Indrek
IEEE transactions on power electronics
2017
/
p. 3634-3650 : ill
https://doi.org/10.1109/TPEL.2016.2591726
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
1015
journal article
High-speed design of postquantum cryptography with optimized hashing and multiplication
Imran, Malik
;
Aikata, Aikata
;
Roy, Sujoy Sinha
;
Pagliarini, Samuel Nascimento
IEEE Transactions on Circuits and Systems II : Express Briefs
2023
/
p. 847-851 : ill
https://doi.org//10.1109/TCSII.2023.3273821
journal article
Seotud publikatsioonid
1
Hardware realization of lattice-based post-quantum cryptography = Võrel põhinev post-kvant-krüptograafia riistvaraline realisatsioon
1016
book article
High-voltage auxiliary power supply with the simplified power circuit topology for the DC trains [Electronic resource]
Vinnikov, Dmitri
;
Laugis, Juhan
Proceedings of the 9th International Conference "Electrical Power Quality and Utilisation" : EPQU'2007 : Barcelona, Spain, October 9-11, 2007
2007
/
[6] p. [CD-ROM]
https://ieeexplore.ieee.org/document/4424227
book article
1017
book article
Higuchi fractal dimension and spectral entropy as measures of depth of sedation in intensive care unit
Anier, Andres
;
Lipping, Tarmo
;
Melto, S.
;
Hovilehto, S.
Proceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society : San Francisco, CA, USA, September 1-5, 2004. Vol. 1
2004
/
p. 526-529 : ill
https://pubmed.ncbi.nlm.nih.gov/17271729/
book article
1018
book article
Hilbert transform, an effective replacement of Park's vector modulus for the detection of rotor faults
Asad, Bilal
;
Vaimann, Toomas
;
Kallaste, Ants
;
Rassõlkin, Anton
;
Belahcen, Anouar
2019 Electric Power Quality and Supply Reliability Conference (PQ) & 2019 Symposium on Electrical Engineering and Mechatronics (SEEM), Kärdla, Estonia, June 12-15, 2019 : proceedings
2019
/
4 p. : ill
https://doi.org/10.1109/PQ.2019.8818227
book article
1019
book article
HLS-based optimization of tau triggering algorithm for LHC: a case study
Cherezova, Natalia
;
Mihhailov, Dmitri
;
Devadze, Sergei
;
Jutman, Artur
2022 18th Biennial Baltic Electronics Conference (BEC)
2022
/
6 p. : ill
https://doi.org/10.1109/BEC56180.2022.9935599
book article
1020
book article
A holistic D-PMU optimal placement framework considering pragmatic constraints in smart grids
Farhizadan, Mohammadreza
;
Karrari, Mehdi
;
Gharehpetian, Gevork B.
;
Ahmadiahangar, Roya
;
Kilter, Jako
;
Rosin, Argo
IEEE 16th International Conference on Compatibility, Power Electronics, and Power Engineering (CPE-POWERENG)
2022
/
7 p.
https://doi.org/10.1109/CPE-POWERENG54966.2022.9880881
book article
1021
journal article EST
/
journal article ENG
Home energy management systems: A review of the concept, architecture, and scheduling strategies
Han, Binghui
;
Zahraoui, Younes
;
Mubin, Marizan
;
Mekhilef, Saad
;
Seyedmahmoudian, Mehdi
;
Stojcevski, Alex
IEEE Access
2023
/
p. 19999-20025
https://doi.org/10.1109/ACCESS.2023.3248502
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
1022
book article
How much is too much - equilibrium points for good export and R&D intensity : data of world top 2000 companies
Rungi, Mait
;
Ida, Andres
IEEM 2015 : 2015 IEEE International Conference on Industrial Engineering and Engineering Management : 6-9 December 2015, Singapore
2015
/
p. 1556-1560 : tab
http://dx.doi.org/10.1109/IEEM.2015.7385908
book article
1023
book article
How much "Talent" is meeded for organizational learning? A study of labor market entrants in an innovation-oriented country
Rungi, Mait
2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2018) : Bangkok, Thailand, 16-19 December 2018
2018
/
p- 361-365 : ill
https://doi.org/10.1109/IEEM.2018.8607440
book article
1024
book article
How online lurking contributes value to e-participation : a conceptual approach to evaluating the role of lurkers in e-participation
Edelmann, Noella
;
Krimmer, Robert Johannes
;
Parycek, Peter
2017 Fourth International Conference on eDemocracy & eGovernment (ICEDEG 2017) : Quito, Ecuador, 19-21 April 2017
2017
/
p. 86-93
https://doi.org/10.1109/ICEDEG.2017.7962517
book article
1025
book article
How to build a SOC on a budget
Vaarandi, Risto
;
Mäses, Sten
2022 IEEE International Conference on Cyber Security and Resilience (CSR)
2022
/
p. 171-177 : ill
https://doi.org/10.1109/CSR54599.2022.9850281
book article
Number of records 2248, displaying
1001 - 1025
previous
37
38
39
40
41
42
43
44
45
46
next
keyword
9
1.
IEEE 1149.1
2.
IEEE 1687
3.
IEEE 802.15.6
4.
IEEE 802156
5.
IEEE 9 bus test system
6.
IEEE C37.118.1
7.
IEEE P1687
8.
IEEE Std. 1687
9.
24th IEEE International Conference on Industrial Technology 2023
TTÜ subject term
1
1.
IEEE
subject term
1
1.
IEEE
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT