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2026
book article
Reinforcement learning for optimal renewable energy sources scheduling
Nejad, Hamid Mohammad
;
Asefi, Sajjad
;
Kilter, Jako
IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT Europe 2024) : proceedings
2024
/
5 p
https://doi.org/10.1109/ISGTEUROPE62998.2024.10863772
book article
2027
book article EST
/
book article ENG
Reinforcement Learning-based Energy Management Strategy for Flexible Hybrid ac/dc Microgrid
Gutiérrez-Escalona, Javier
;
Roncero-Clemente, Carlos
;
Husev, Oleksandr
;
Matiushkin, Oleksandr
;
Barrero-González, Fermín
;
González-Romera, Eva
IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society
2025
/
6 p
https://doi.org/10.1109/IECON55916.2024.10905501
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
2028
book article
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
Palermo, N.
;
Tihhomirov, Valentin
;
Copetti, Thiago
;
Jenihhin, Maksim
;
Raik, Jaan
;
Kostin, Sergei
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102405
book article
2029
book article EST
/
book article ENG
Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programs
Pellerey, Francesco
;
Jenihhin, Maksim
;
Squillero, Giovanni
;
Raik, Jaan
;
Sonza Reorda, Matteo
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan
2016
/
p. 304-309 : ill
https://doi.org/10.1109/ATS.2016.57
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
2030
book article
Relation learning with bar charts
Lints, Taivo
IA'09 : IEEE Symposium on Intelligent Agents : Nashville, Tennessee, US, March 30-April 2, 2009
2009
/
p. 77-83
https://ieeexplore.ieee.org/document/4927503
book article
2031
book article EST
/
book article ENG
Relations between modules associated to input-output nonlinear equations with delays and their realizations
Bartosiewicz, Zbigniew
;
Kaldmäe, Arvo
;
Kotta, Ülle
;
Wyrwas, Malgorzata
62nd IEEE Conference on Decision and Control, CDC 2023, Singapore, 13-15 December 2023
2023
/
p. 644-650
https://doi.org/10.1109/CDC49753.2023.10383927
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
2032
book article
Reliability analysis and energy yield of string-inverter considering monofacial and bifacial photovoltaic panels
Bouguerra, Sara
;
Yaiche, Mohamed Redha
;
Sangwongwanich, Ariya
;
Blaabjerg, Frede
;
Liivik, Elizaveta
2020 IEEE 11th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), 28 Sept.-1 Oct. 2020, Dubrovnik, Croatia
2020
/
p. 199-204
https://doi.org/10.1109/PEDG48541.2020.9244425
book article
2033
book article
Reliability analysis of micro-inverters considering PV module variations and degradation rates
Liivik, Elizaveta
;
Sangwongwanich, Ariya
;
Blaabjerg, Frede
2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) : Riga, Latvia, 17-21 September 2018
2018
/
p. 1475-1482 : ill
https://ieeexplore.ieee.org/document/8515325
book article
2034
book article
Reliability assessment of photovoltaic Buck-Boost microconverter for Estonian climate conditions
Bakeer, Abualkasim Ahmed Ali
;
Chub, Andrii
;
Vinnikov, Dmitri
2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)
2023
/
6 p
https://doi.org/10.1109/CPE-POWERENG58103.2023.10227505
book article
2035
book article EST
/
book article ENG
Reliability evaluation of an impedance-source PV microconverter
Shen, Yanfeng
;
Liivik, Elizaveta
;
Blaabjerg, Frede
;
Vinnikov, Dmitri
;
Wang, Huai
;
Chub, Andrii
2018 IEEE Applied Power Electronics Conference and Exposition (APEC 2018), San Antonio, Texas, USA, 4-8 March 2018
2018
/
p. 1104–1108 : ill
https://doi.org/10.1109/APEC.2018.8341154
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
2036
journal article EST
/
journal article ENG
Reliability evaluation of isolated buck-boost DC-DC series resonant converter
Bakeer, Abualkasim Ahmed Ali
;
Chub, Andrii
;
Shen, Yanfeng
IEEE open journal of power electronics
2022
/
p. 131-141
https://doi.org/10.1109/OJPEL.2022.3157200
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Related publications
1
Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid
2037
book article
Reliability evaluation of the universal power electronic interface converter for PV applications
Khan, Salman
;
Chub, Andrii
;
Vinnikov, Dmitri
;
Kasper, Matthias
;
Deboy, Gerald
2024 IEEE 21st International Power Electronics and Motion Control Conference (PEMC)
2024
/
8 p
https://doi.org/10.1109/PEMC61721.2024.10726360
Article at Scopus
Article at WOS
book article
2038
book article
Reliability improvements for multiprocessor systems by health-aware task scheduling
Schmidt, Robert
;
Massoud, Rehab
;
Raik, Jaan
;
Garcia-Ortiz, Alberto
;
Drechsler, Rolf
2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design (IOLTS 2018) : 2 - 4 July 2018, Spain
2018
/
p. 247-250 : ill
http://dx.doi.org/10.1109/IOLTS.2018.8474101
book article
2039
book article
Reliability of DC-link capacitors in two-stage micro-inverters under different PV module sizes
Sangwongwanich, Ariya
;
Shen, Yanfeng
;
Chub, Andrii
;
Liivik, Elizaveta
;
Vinnikov, Dmitri
;
Wang, Huai
;
Blaabjerg, Frede
ICPE 2019 - ECCE Asia : 10th International Conference on Power Electronics - ECCE Asia : "Green World with Power Electronics" : May 27-30, 2019 BEXCO, Busan, Korea
2019
/
p. 1867-1872 : ill
https://ieeexplore.ieee.org/xpl/conhome/8786807/proceeding
book article
2040
book article EST
/
book article ENG
Reliability of electroencephalogram-based individual markers - case study
Uudeberg, Tuuli
;
Päeske, Laura
;
Hinrikus, Hiie
;
Lass, Jaanus
;
Bachmann, Maie
2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)
2020
/
p. 276 - 279
https://doi.org/10.1109/EMBC44109.2020.9175274
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
2041
book article EST
/
book article ENG
Reliability study of input side capacitors in impedance-source PV microconverters
Liivik, Elizaveta
;
Vinnikov, Dmitri
;
Chub, Andrii
;
Shen, Yanfeng
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society : proceedings
2019
/
p. 5026–5032 : ill
https://doi.org/10.1109/IECON.2019.8927173
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
2042
journal article EST
/
journal article ENG
Reliability-critical computation offloading in UAV swarms
Rahbari, Dadmehr
;
Ahmed, Foisal
;
Jenihhin, Maksim
;
Alam, Muhammad Mahtab
;
Le Moullec, Yannick
IEEE Systems Journal
2024
/
p. 1871-1882
https://doi.org/10.1109/JSYST.2024.3432449
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
2043
book article
Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687
Jutman, Artur
;
Shibin, Konstantin
;
Devadze, Sergei
IEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings
2016
/
p. 240-249 : ill
https://doi.org/10.1109/AUTEST.2016.7589605
book article
2044
book article EST
/
book article ENG
Remote data transfer and comparative performance through PyBaMM and mathematical techniques in battery applications
Zequera, Rolando Antonio Gilbert
;
Rassõlkin, Anton
;
Belolipetskaja, Diana
2025 IEEE Seventh International Conference on DC Microgrids (ICDCM)
2025
/
6 p
https://doi.org/10.1109/ICDCM63994.2025.11144690
book article EST
/
book article ENG
2045
book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
2046
book article
Representing gate-level SET faults by multiple SEU faults on RT-level
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Sauer, Christian
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
2020
/
art. 19889351, 6 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159715
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2047
journal article EST
/
journal article ENG
Requirements elicitation and specification using the agent paradigm : the case study of an aircraft turnaround simulator
Miller, Tim
;
Lu, Bin
;
Sterling, Leon
;
Beydoun, Ghassan
;
Taveter, Kuldar
IEEE transactions on software engineering
2014
/
p. 1007-1024 : ill
https://doi.org/10.1109/TSE.2014.2339827
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
2048
book article
Requirements to data acquisition and signal analysis for electrical grid condition monitoring
Anijärv, Toomas Erik
;
Shabbir, Noman
;
Kütt, Lauri
;
Iqbal, Muhammad Naveed
2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings
2020
https://doi.org/10.1109/RTUCON51174.2020.9316487
book article
2049
journal article
RESAA: A Removal and Structural Analysis Attack Against Compound Logic Locking
Almeida, Felipe
;
Aksoy, Levent
;
Pagliarini, Samuel Nascimento
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2025
/
p. 1348-1360
https://doi.org//10.1109/TVLSI.2025.3534658
journal article
Related publications
1
Advanced Hardware Protection Mechanisms : A Study on Logic Locking and Circuit Obfuscation Techniques [Võrguteavik] = Täiustatud riistvara kaitsemehhanismid : uuring loogikalukustamise ja hägustamise tehnikate kohta
2050
book article
RESCUE : cross-sectoral PhD training concept for interdependent reliability, security and quality
Vierhaus, Heinrich Theodor
;
Jenihhin, Maksim
;
Sonza Reorda, Matteo
2018 12th European Workshop on Microelectronics Education (EWME) : September 24–26, 2018
2018
/
p. 45-50 : ill
https://doi.org/10.1109/EWME.2018.8629465
book article
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