Vain, J., Kaur, A., Tsiopoulus, L., Raik, J., Jenihhin, M.

Multi-view modeling for MPSoC design aspects [Online resource]

author

Vain, Jüri

Apneet Kaur

Tsiopoulos, Leonidas

Raik, Jaan

Jenihhin, Maksim

statement of authorship

Juri Vain, Apneet Kaur, Leonidas Tsiopoulos, Jaan Raik, Maksim Jenihhin

source

BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018

publisher

IEEE

year of publication

2018

pages

4 p.: ill

conference name, date

16th Biennial Baltic Electronics Conference (BEC), October 8-10, 2018

conference location

Tallinn, Estonia

url

https://doi.org/10.1109/BEC.2018.8600986

subject term

kiipvõrgud

testimine

programmeerimiskeeled

tarkvaraarendus

keyword

network-on-chip

model-checking

UPPAAL timed automata

design aspects

Design-by-Contract

ISSN

1736-3705

ISBN

978-1-5386-7313-3

notes

Bibliogr.: 10 ref

TTÜ department

tarkvarateaduse instituut

arvutisüsteemide instituut

language

inglise

Uurimisrühm

Centre for digital forensics and cyber security

Centre for maritime cybersecurity

High-assurance software laboratory

Centre for trustworthy and efficient computing hardware (TECH)

Centre of dependable computing systems

Vain, J., Kaur, A., Tsiopoulus, L., Raik, J., Jenihhin, M. Multi-view modeling for MPSoC design aspects [Online resource] // BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018. : IEEE, 2018. 4 p.: ill. https://doi.org/10.1109/BEC.2018.8600986