Jenihhin, M., Squillero, G., Tihhomirov, V., Kostin, S., Raik, J., Ubar, R. et al.

Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits

author

Jenihhin, Maksim

Squillero, Giovanni

Tihhomirov, Valentin

Kostin, Sergei

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros

source

Journal of electronic testing : theory and applications (JETTA)

journal volume number month

Vol. 32, 3

year of publication

2016

pages

p. 273-289 : ill

url

http://dx.doi.org/10.1007/s10836-016-5589-x

subject term

elektronlülitused

loogikaelemendid

diagnostika (tehnika)

keyword

hardware rejuvenation

aging

NBTI

critical path identification

logic circuit

evolutionary computation

microGP

zamiaCAD

ISSN

0923-8174

notes

Bibliogr.: 44 ref

TTÜ department

arvutitehnika instituut

language

inglise

Jenihhin, M., Squillero, G., Tihhomirov, V., Kostin, S., Raik, J., Ubar, R. et al. Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits // Journal of electronic testing : theory and applications (JETTA) (2016) Vol. 32, 3, p. 273-289 : ill. http://dx.doi.org/10.1007/s10836-016-5589-x