Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits
author
statement of authorship
Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
publisher
journal volume number month
Vol. 32, 3
year of publication
pages
p. 273-289 : ill
ISSN
0923-8174
notes
Bibliogr.: 44 ref
scientific publication
teaduspublikatsioon
language
inglise
classifier
kvartiil
category (general)
category (sub)
TTÜ department
Jenihhin, M., Squillero, G., Tihhomirov, V., Kostin, S., Raik, J., Ubar, R. et al. Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits // Journal of electronic testing : theory and applications (JETTA) (2016) Vol. 32, 3, p. 273-289 : ill.