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Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties (title)
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journal article
Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
Kropman, Daniel
;
Mellikov, Enn
;
Kärner, Tiit
;
Heinmaa, Ivo
;
Laas, Tõnu
;
Londos, Charalampos
;
Misiuk, Andrzej
Solid state phenomena
2011
/
p. 263-266
journal article
2
journal article
Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
Kropman, Daniel
;
Kärner, Tiit
;
Dolgov, Sergei
;
Heinmaa, Ivo
;
Laas, Tõnu
;
Londos, Charalampos
Physica status solidi (c)
2011
/
p. 694-696 : ill
journal article
3
book article
Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
Kropman, Daniel
;
Kärner, Tiit
;
Dolgov, Sergei
;
Heinmaa, Ivo
;
Laas, Tõnu
;
Londos, C. A.
The 9th International Conference on Global Research and Education : August 9-12, 2010, Riga : digest
2010
/
p. 231-233
https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564
book article
Number of records 3, displaying
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keyword
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1.
Si-SiO2 interface
2.
Si-SiO2-Si3N4 interface
3.
point defects
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