Ubar, R., Brik, M., Jutman, A., Raik, J., Bengtsson, T., Kumar, S.

full record print

Functional test generation for finite state machines

author

Ubar, Raimund-Johannes

Brik, Marina

Jutman, Artur

Raik, Jaan

Bengtsson, Tomas

Kumar, Shashi

statement of authorship

R.Ubar, M.Brik, A.Jutman, J.Raik, T.Bengtsson, S.Kumar

source

BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference

location of publication

[Tallinn]

publisher

Tallinn University of Technology

year of publication

2006

pages

p. 205-208 : ill

ISBN

1-4244-0414-2

notes

Bibliogr.: 16 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

testimine

VLSI-ahelad

Ubar, R., Brik, M., Jutman, A., Raik, J., Bengtsson, T., Kumar, S. Functional test generation for finite state machines // BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference. [Tallinn] : Tallinn University of Technology, 2006. p. 205-208 : ill.